| Original language | English (US) |
|---|---|
| Pages (from-to) | 306 |
| Number of pages | 1 |
| Journal | Microelectronics Reliability |
| Volume | 91 |
| DOIs | |
| State | Published - Dec 2018 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering